TY  - JOUR
AU  - Jukna, T.
AU  - Sinkevicius, V.
AU  - Urbanaviciute, L.
PY  - 2014/02/05
Y2  - 2025/01/02
TI  - Influence of Emitted Electrons on the Method for Direct Measurement of Condensate Resistance
JF  - Elektronika ir Elektrotechnika
JA  - ELEKTRON ELEKTROTECH
VL  - 20
IS  - 2
SE  - 
DO  - 10.5755/j01.eee.20.2.6379
UR  - https://eejournal.ktu.lt/index.php/elt/article/view/6379
SP  - 28-31
AB  - Electrical resistance of the vacuum-deposited condensate has non-linear relation to the condensate film thickness. Therefore, there exists a need for experiments to study applicability of the non-invasive method for condensate resistance measurement and to identify parameters by measuring condensate resistance directly. By using two-point measurement probes, this study analyses the influence of electrons emitted in the process of evaporator electronic emission on the method for direct measurement of condensate resistance. <p>DOI: <a href="http://dx.doi.org/10.5755/j01.eee.20.2.6379">http://dx.doi.org/10.5755/j01.eee.20.2.6379</a></p>
ER  -