TY  - JOUR
AU  - Huzum, C.
AU  - Cascaval, P.
PY  - 2012/03/14
Y2  - 2025/01/02
TI  - March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories
JF  - Elektronika ir Elektrotechnika
JA  - ELEKTRON ELEKTROTECH
VL  - 119
IS  - 3
SE  - 
DO  - 10.5755/j01.eee.119.3.1369
UR  - https://eejournal.ktu.lt/index.php/elt/article/view/1369
SP  - 81-86
AB  - A multibackground March test (March-76N) for a model of static neighborhood pattern sensitive faults (NPSFs) in <em>N</em> ´ 1 random-access memories is presented. March-76N is able to cover both simple and linked NPSFs. As any other test dedicated to the NPSFs, March-76N assumes that the storage cells are arranged in a rectangular grid and the mapping from logical addresses to physical cell locations is known completely. With a length of 76<em>N</em>,<em> </em>this March test is more efficient than other published tests dedicated to this model. Ill. 4, bibl. 16, tabl. 4 (in English; abstracts in English and Lithuanian).<p>DOI: <a href="http://dx.doi.org/10.5755/j01.eee.119.3.1369">http://dx.doi.org/10.5755/j01.eee.119.3.1369</a></p>
ER  -