TY  - JOUR
AU  - Eidukas, D.
PY  - 2010/03/02
Y2  - 2025/01/02
TI  - Modeling of Level of Defects in Electronics Systems
JF  - Elektronika ir Elektrotechnika
JA  - ELEKTRON ELEKTROTECH
VL  - 99
IS  - 3
SE  - 
DO  - 
UR  - https://eejournal.ktu.lt/index.php/elt/article/view/9896
SP  - 13-16
AB  - <p>This publication is about continuous between-operational control main probabilities characteristics modelling techniques for multilevel ES, when separate independent parameters defect level probabilities distributions are set (known) in chosen control schematics. Made ES defect level probability density direct and reverse transformations models by separate parameter levels densities transformations. Offered to use approximated models instead of exact whole ES defect level because of complicated process of integration and models get more simple expressions. Ill. 1, bibl. 7 (in English; abstracts in English, Russian and Lithuanian).</p>
ER  -